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发明名称
Eingebaute Selbsttestschaltung mit einem Schieberegister mit linearer Rückkopplung
摘要
申请公布号
DE60116046(T2)
申请公布日期
2006.09.14
申请号
DE20016016046T
申请日期
2001.06.29
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, HEON-CHEOL;PARK, JIN-YOUNG
分类号
G11C29/20
主分类号
G11C29/20
代理机构
代理人
主权项
地址
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