发明名称 Method of and arrangement for measuring impedances in measuring circuits having programmed memory
摘要 A method of and arrangement for measuring impedances, particularly low capacitances, by alternately connecting one or more reference impedances and sensor impedances to a measuring circuit. A programmed memory is used to take into account the individual non-linearities of the impedance sensor(s) and, optionally, to compensate variations of ambient circumstances such as temperature.
申请公布号 US4751654(A) 申请公布日期 1988.06.14
申请号 US19850791911 申请日期 1985.10.28
申请人 VAISALA OY 发明人 LYYRA, MATTI
分类号 G01R27/02;G01D3/028;G01N27/02;G01R15/00;(IPC1-7):G01R27/26;G01R27/00;G08C15/06 主分类号 G01R27/02
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