发明名称 INSPECTION METHOD FOR SUBSTRATE
摘要 PURPOSE:To perform inspection even when the color of components is alike to the color of a substrate where the components are mounted after preflux containing a daylight excited fluorescent agent is applied by picking up and image of the substrate momentarily while irradiating the substrate with light containing exciting light, and discriminating the fluorescent part and nonfluorescent part of the image pickup result and inspecting the mounting state of the components on the substrate. CONSTITUTION:A mechanical shutter 20 is put in operation to pick up an image of printed boards 10-1 and 10-2 momentarily. Consequently, the still picture can be obtained while the printed boards 10-1 and 10-2 are conveyed. Further, the preflux containing the daylight excited fluorescent agent is applied over an unmounted substrate before a component 13a (or 13b) is mounted. Consequently, even when the ground color of the printed boards and the color of the components 13a and 13b are the same, accurate silhouettes of the components 13a and 13b are obtained. Consequently, even when the color of the components and the color of the substrate are the same or alike to each other, all components can be inspected about their falls, misalignments etc.
申请公布号 JPS63113679(A) 申请公布日期 1988.05.18
申请号 JP19860256989 申请日期 1986.10.30
申请人 OMRON TATEISI ELECTRONICS CO 发明人 KOBAYASHI SHIGEKI
分类号 H01L21/66;G01B11/00;G01B11/24;G01N21/88;G01N21/91;G01N21/93;G01N21/956;G06T1/00;H05K13/08 主分类号 H01L21/66
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