发明名称 Memory cell having hot-hole injection erase mode
摘要 A single component electrically erasable memory cell is disclosed. A floating gate MOSFET having a relatively short channel is triggered into a snap-back mode positive feedback biasing mechanism. Hot-hole injection onto the floating gate during the snap-back mode neutralizes any charge stored there to represent a data bit.
申请公布号 US4742491(A) 申请公布日期 1988.05.03
申请号 US19850780482 申请日期 1985.09.26
申请人 ADVANCED MICRO DEVICES, INC. 发明人 LIANG, MONG-SONG;LEE, TIEN-CHIUN
分类号 G11C17/00;G11C16/04;G11C16/06;G11C16/14;G11C16/16;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C7/00 主分类号 G11C17/00
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