| 摘要 |
PURPOSE:To enable inspection having excellent efficiency, and to simplify a wiring in an IC by adding a circuit for simple inspection thereto. CONSTITUTION:A circuit 12 for inspection and a control terminal 14 transmitting a control signal for a switching element 32 forcibly brings a plurality of inspection requiring nodes for the circuit 12 to the same potential from the outside are fitted to an IC circuit 8. A signal is input from a terminal 2, a functional circuit 4 is brought to the specific state of operation, and all the switching elements 32 are brought simultaneously to an ON state by the control signal from the terminal 14 regarding a plurality of the inspection requiring nodes. Accordingly, the inspection requiring nodes are brought forcibly to the same potential, a current value flowing through a measuring terminal 3 as a power terminal for a normal IC is used as an expected current value on the control of the nodes, and a defective IC is detected by the difference between the current value of a defective IC circuit and the expected current value.
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