| 摘要 |
An in-circuit automatic test equipment has several channel control arrays (20), each of which can supply test signals to or receive output signals from a unit under test (16) via any one of 8 test nails (14) per array, selected by relays (18). In addition, second and third relays (44, 46) connected to each nail permit currently unselected nails to be used to apply guard signals elsewhere in the UUT. |
