发明名称 Method of forming alignment marks in sapphire
摘要 Indicia are formed in a sapphire substrate by ion implantation with a sufficient amount of silicon ions to establish a contrast with the remainder of the substrate. The implant is annealed at 1050 DEG to 1200 DEG C. under an oxygen or inert atmosphere. The implants are stable to repeated heatings to elevated temperature. The implants are further beneficial in that they do not introduce a source of contamination into the substrate.
申请公布号 US4732867(A) 申请公布日期 1988.03.22
申请号 US19860925983 申请日期 1986.11.03
申请人 GENERAL ELECTRIC COMPANY 发明人 SCHNABLE, GEORGE L.
分类号 H01L27/12;H01L21/02;H01L21/20;H01L21/68;H01L23/544 主分类号 H01L27/12
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