| 摘要 |
A novel internal reflection element and associated optics for examining micro- or nano-gram quantities of a sample material by internal reflection spectroscopy, wherein the element is sized for ease of handling, and is configured to allow entrance of a radiation beam at one end, to guide the radiation to the opposite end, to concentrate the guided radiation at a small triangular-shaped sampling surface, from which the beam is directed out of the element. Adjustable masking means is also provided to reduce the unmodulated content or undesired portions of the exiting beam.
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