发明名称 CLEANING METHOD FOR PLASMA CVD DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the throughput by the shrinkage of the cleaning time and to reduce the contamination of heavy metal. SOLUTION: In a plasma CVD device having an upper electrode 7, a susceptor 8 and a cylindrical electrode 3, the susceptor 8 is composed so as to be freely approached and separated to and from the upper electrode 7. At the time of cleaning, a stage in which, in a state in which the susceptor 8 is separated from the upper electrode 7, high frequency electric power is applied to the cylindrical electrode 3 to generate magnetron discharge type plasma in a reaction chamber, and the inside of the reaction chamber is cleaned and a stage in which, in a state in which the susceptor 8 is approached to the upper electrode 7, high frequency electric power is applied to the upper electrode 7 to generate capacity coupling type plasma in the reaction chamber, and the inside of the reaction chamber is cleaned are almost simultaneously executed.
申请公布号 JP2000355768(A) 申请公布日期 2000.12.26
申请号 JP19990165932 申请日期 1999.06.11
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SATO TAKAYUKI;YAMASUMI NAOYA
分类号 H01L21/302;C23C16/44;C23C16/509;H01L21/205;H01L21/3065;(IPC1-7):C23C16/44;H01L21/306 主分类号 H01L21/302
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