| 摘要 |
The invention relates to a method for automated particle size measurement of particles, which is essentially characterised in that it comprises at least the following steps: acquiring a three-dimensional scatterplot of the surface of the particle to be examined by passing said particle in front of an optical device (2); using the scatterplot to characterise the overall shape of the particle (4) by the play of projection coefficients CE on a projection base [F], said projection base [F] being determined by the steps of: acquiring a three-dimensional scatterplot of the surface of at least one reference particle by passing said particle (4,6) in front of an optical device (2,2a), reducing the characterisation of the surface of the reference particle (4,6) to a vector R with N dimensions from the cloud of points obtained in the preceding step, and determining the projection base [F] making it possible to characterise the overall shape of the reference particle by the play of the projection coefficients CE on said base [F]. The invention also relates to a method for assessing the morphological deformation of a population of q particles to be examined relative to a t population of p reference particles using the aforementioned automated particle size measurement method. |
