| 摘要 |
The disclosure is directed to a non-contacting gage apparatus and method of the type wherein radiation attenuation is measured to obtain thickness information. A first function is developed and is representative of the thickness of standard pieces versus measurement values. A second function is developed and is representative of the Absorption Index of alloy material (to be measured) versus thickness. Calibration can then be effected using the two functions and the nominal thickness of material to be measured. |
