| 摘要 |
In an integrated circuit having a multiplicity of linearly interconnected modules with the same function, a by-pass stage (20) is allocated to each module (10). If one of the modules (10) proves to be malfunctioning (for example due to a local pattern defect in the integrated circuit) during testing, the associated by-pass stage (20) is activated by a conditioning signal and ensures that the signals present at the input of the module are directly by-passed to the output. The conditioning signal is obtained by the connection (17) of the relevant module (10) being disconnected from the supply voltage line (21). <IMAGE>
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