| 摘要 |
PURPOSE:To detect the thickness of each layer of a refractory wall by applying an impulse to the refractory wall from outside its surface layer, and receiving reflected waves from respective layers and processing an elastic waveform signal. CONSTITUTION:The shell 7 of the refractory wall is given an impulse once with an electromagnetic hammer 1 and an elastic wave pulse of high frequency which is generated at this time is received by an impulse sensor 2 in contact with the surface of the shell 7; and the start point of the elastic wave is inputted as a trigger current to a waveform amplifying processor 4. The elastic wave is propagated in the shell 7, a stamp material 8, a refractory material 9, a consistency layer 10, and molten metal 11 in order, but reflected partially by their back surfaces respectively. Reflected waves are senses by a receiving sensor 3 to send a signal to the processor 4. The signal waveform is mixed with the trigger, a filter cuts a secondary reflected wave, etc., and the resulting signal is inputted to a waveform storage device such as an oscilloscope 6, thereby measuring the distance from its pulse interval. Namely, the frequency of the elastic wave is selected properly according to a layer to be measured and the velocity of the elastic wave in the layer is investigated previously to detect the thickness of the desired layer.
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