发明名称 INSPECTING UNIT FOR GLASS-SEALED DIODE
摘要 PURPOSE:To shorten a diode inspecting time by clamping both the leads of the diode and applying a tension thereto by a plurality of clamping mechanism and clamp pulling mechanisms on disks to be clamped and rotated in the same direction as a diode feeding drum on the way of feeding the diode. CONSTITUTION:Leads 5, 6 of a diode 1 are clamped by clamping mechanisms 21 provided on one clamping disk 20 rotated in the same direction as a diode feeding drum 10 and clamp pulling mechanism 21 provided on the other clamping disk 20a rotated in the same direction as the drum 10 on the way of feeding the diode 1 supplied by supplying means to cutouts 12 by the rotation of a diode feeding drum 12 to measure a current flowing between the leads 5 and 6 in the state that a tension is not applied to the leads 5, 6. The tension is applied to the leads 5, 6 by reversely moving the mechanism 21 on the other disk, and a current flowing between the leads is measured in this tensioned state.
申请公布号 JPS62295427(A) 申请公布日期 1987.12.22
申请号 JP19860138878 申请日期 1986.06.13
申请人 ROHM CO LTD 发明人 KURITA YOSHIO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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