发明名称 |
HIGH-FREQUENCY SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To enable high-frequency characteristics such as input and output impedances at ends of a chip to be determined while obviating the need of assembling them, by arranging surface grounding electrodes connected to an underside electrode of a substrate at the input and output ends of a strip-type transmission line. CONSTITUTION:Input and output matching circuits 1 and 2 are formed integrally on the input and output sides of an FET 3 on the principal surface of a semi- insulating GaAs substrate 4. Surface grounding electrodes 5 are arranged on the opposite sides of the input and output ends of a strip-type transmission line. The electrodes 5 are electrically connected to an underside electrode through a V-shaped groove 6. A surface striptype line electrode 7 is located in the middle of the grounding electrodes 5 and the grounding electrodes 5 are electrically connected to an underside strip-type line electrode 8 through the V-shaped groove 6. Accordingly, an impedance at the input or output end of a chip can be determined by using a highfrequency probe or the like without assembling the chip with a bonding wire but as it is in the condition of a wafer or the chip itself.
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申请公布号 |
JPS62291976(A) |
申请公布日期 |
1987.12.18 |
申请号 |
JP19860136507 |
申请日期 |
1986.06.12 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ISHIKAWA OSAMU |
分类号 |
H01L29/812;H01L21/338;H01L23/12;H01L29/41;H01L29/80;H01P1/00 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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