发明名称 MEASURING METHOD FOR TWO-DIMENSIONAL FREELY CURVED SURFACE
摘要 PURPOSE:To easily perform quantitative evaluation by applying a touch sensor to plural measurement points which are set at proper intervals in a normal direction and measuring two-dimensional coordinate size. CONSTITUTION:A measurement point P is determined in a free curved surface 1, differentiation is performed at the point P to draw a tangent to the free curved surface, and a line A perpendicular to it is defined. Then, X-Y coordinates are converted so that the Y axis of an X-Y coordinate system is parallel to the axis A, and the coordinate system is regarded as an X'-Y' axis. The coordinates of the measurement point P are also converted to the X'-Y' coordinate system. Then, the touch sensor is put closer in parallel to the Y' axis to measure the coordinate values (x', y') of the point P. Then, a measurement point P is set on the curved surface 1 at a proper interval and its coordinate values are found similarly. Then, the profile of the curved surface is easily and quantitatively obtained.
申请公布号 JPS62289710(A) 申请公布日期 1987.12.16
申请号 JP19860134219 申请日期 1986.06.10
申请人 MITSUBISHI HEAVY IND LTD 发明人 KAWAI WATARU
分类号 G01B21/00;G01B21/20 主分类号 G01B21/00
代理机构 代理人
主权项
地址