发明名称 METHOD FOR FORMING COPLANAR CONDUCTOR/INSULATOR FILMS
摘要 <p>Coplanar conductor/insulator films with at least one level of metallization are produced by forming on a substrate a conductive pattern (5A, 6A) of a composite consisting of a lower layer (5A) of an aluminum based metal and an upper layer (6A) of hafnium with a coating (7A) of magnesium oxide covering its top surface, blanket depositing a layer of dielectic material whose thickness equals that of the conductive pattern, and wet etching said coating (7) of magnesium oxide for removal thereof together with the overlying portions of said dielectric coating thereon. …<??>To produce structures with interconnected, coplanar conductor/insulator films on different levels the above process steps are repeated once or several times. …<??>The hatnium layer is used to protect the aluminum based metal during the removal of the magnesium oxide, and as a registration enhancer for subsequent electron-beam processing.</p>
申请公布号 EP0082515(B1) 申请公布日期 1987.11.25
申请号 EP19820111807 申请日期 1982.12.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 PLATTER, VALERIA;ROTHMAN, LAURA B.;SCHAIBLE, PAUL M.;SCHWARTZ, GERALDINE C.
分类号 H01L21/3205;H01L21/302;H01L21/3065;H01L21/3213;H01L21/48;H01L21/768;H01L23/498;H01L23/532;H05K3/46;(IPC1-7):H01L21/90;H01L23/52 主分类号 H01L21/3205
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