发明名称 METHOD FOR ETCHING SILICON LAYER ON SILICON CARBIDE
摘要 PURPOSE:To selectively dry-etch only the Si layer of a substrate having a two- layered structure consisting of SiC and Si by etching the surface of the substrate in an etching atmosphere having no vertical principal accelerating component. CONSTITUTION:An Si layer is deposited on the surface of SiC and only the Si layer of the resulting substrate is selectively dry-etched. At this time, a barrel type plasma etching apparatus, a laser etching apparatus or like is used and a dry etching method by which ions of an etching gas are not vertically accelerated on the surface of the substrate is adopted. Thus, only the Si layer can be finely processed by chemical etching without damaging the SiC.
申请公布号 JPS62250187(A) 申请公布日期 1987.10.31
申请号 JP19860093586 申请日期 1986.04.23
申请人 AGENCY OF IND SCIENCE & TECHNOL 发明人 KONDO YASUSHI;TAKAHASHI TETSUO;HAYASHI YUTAKA
分类号 C30B33/00;C23F4/00;C23F4/04;C30B33/12;H01L21/302;H01L21/3065 主分类号 C30B33/00
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