发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To accelerate an MOSFET by forming impurity regions in portions which become source.drain and gate regions on a substrate, selectively removing the impurity region of the portion which becomes the gate region, and forming a gate electrode in its groove, thereby using a low melting point metal electrode. CONSTITUTION:A groove 12 is formed on one main surface of a substrate 11, and an insulator is buried to form a separating layer 14 between elements. Then, impurity ions 17 are implanted, for example, through an SiO2 film 16 on the entire surface over the source, drain and gate regions of regions 15 to be formed with an MOSFET, and heat treated to be activated to form an impurity region 18. Then, it is selectively etched to form a groove 19, and the region 18 is used for a source region 20 and a drain region 21. Then, a gate insulating film 22 is formed in the groove 19, the entire surface is covered with an aluminum layer, and removed by etching until the aluminum layers corresponding to the regions 20, 21 are eliminated. An aluminum gate electrode 23 is formed in the groove 19.
申请公布号 JPS62243366(A) 申请公布日期 1987.10.23
申请号 JP19860086725 申请日期 1986.04.15
申请人 SONY CORP 发明人 HAMASHIMA TOSHIKI
分类号 H01L29/78 主分类号 H01L29/78
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