发明名称 |
Temperature detector. |
摘要 |
<p>A temperature detector comprising a semiconductor layer made of a p-type or n-type semiconductor material doped with an impurity. Said layer is either completely amorphous or substantially amorphous, in which case it contains microcrysta1s. The temperature detector has good sensitivity at a temperature of not more than 100 K in comparison to conventional temperature detectors, and shows good linearity concerning its change in resistivity upon changes in temperature over a wide temperature range.</p> |
申请公布号 |
EP0241932(A2) |
申请公布日期 |
1987.10.21 |
申请号 |
EP19870105643 |
申请日期 |
1987.04.16 |
申请人 |
KANEGAFUCHI KAGAKU KOGYO KABUSHIKI KAISHA |
发明人 |
HOSOKAWA, YOICHI;YAMAGUCHI, MINORI;TAWADA, YOSHIHISA |
分类号 |
G01K7/01;G01K7/00;G01K7/22;H01C7/04;H01L21/822;H01L27/04 |
主分类号 |
G01K7/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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