发明名称 Temperature detector.
摘要 <p>A temperature detector comprising a semiconductor layer made of a p-type or n-type semiconductor material doped with an impurity. Said layer is either completely amorphous or substantially amorphous, in which case it contains microcrysta1s. The temperature detector has good sensitivity at a temperature of not more than 100 K in comparison to conventional temperature detectors, and shows good linearity concerning its change in resistivity upon changes in temperature over a wide temperature range.</p>
申请公布号 EP0241932(A2) 申请公布日期 1987.10.21
申请号 EP19870105643 申请日期 1987.04.16
申请人 KANEGAFUCHI KAGAKU KOGYO KABUSHIKI KAISHA 发明人 HOSOKAWA, YOICHI;YAMAGUCHI, MINORI;TAWADA, YOSHIHISA
分类号 G01K7/01;G01K7/00;G01K7/22;H01C7/04;H01L21/822;H01L27/04 主分类号 G01K7/01
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