发明名称 ION SOURCE DEVICE
摘要 PURPOSE:To obtain a uniform ion beam in a wide range and to improve the durability of an ion source device by supplying the electrons generated from an electron generator into a plasma forming chamber and starting high-frequency discharge by said electrons. CONSTITUTION:A one-body hermetic vessel is constituted of the plasma forming chamber 1 and a processing chamber 2 and the inside thereof is evacuated to a vacuum state through a discharge port 4. CF4, etc., are introduced through a gas introducing port 5 into the vessel to a prescribed pressure. An electrode 6 for leading out the ion beam is constituted of the 1st grid 7 and the 2nd grid 8. A positive high voltage is first impressed to the 1st grid 7 and electric current is inputted to the electron generating source 15 to generate the electrons 14. The impressed voltage of the 2nd grid 8 is controlled to the ground potential in this stage and the electrons 14 are accelerated by the positive high voltage. The high-frequency power is then impressed to a high-frequency coil 9 to start high-frequency discharge, by which the plasma density is quickly increased and the sustaining high-frequency discharge is generated. A negative voltage is further impressed to the 2nd grid 8 and the input power source to the electron generating source 15 is decreased so that the operation is smoothly shifted to an ordinary ion beam etching operation state.
申请公布号 JPS62235485(A) 申请公布日期 1987.10.15
申请号 JP19860077751 申请日期 1986.04.04
申请人 HITACHI LTD 发明人 ONO YASUNORI;KUROSAWA TOMOE;SATO TADASHI;KUROSAWA YUKIO;HAKAMATA YOSHIMI
分类号 C23C14/48;C23F4/00;G21K5/04;H01J27/16;H01J27/20;H01J27/24;H01J37/08;H01J37/305;H01J37/317 主分类号 C23C14/48
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