发明名称 INPUT PROTECTION DEVICE OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To obtain a small size protection device having high protection performance by providing particular 1st-5th semiconductor layers and 1st-2nd metal wires to the surface of a semiconductor substrate. CONSTITUTION:A 1st semiconductor layer 2 of a 2nd conductivity type is provided on the surface of a semiconductor substrate 1 of a 1st conductivity type and a second semiconductor layer 4 of the 1st conductivity type adjacent to the end part of the 1st semiconductor layer 2, a 3rd semiconductor layer 5 of the 1st conductivity type and a 4th semiconductor layer 6 of the 2nd conductivity type are provided further on the surface of said 2nd semiconductor layer 4. Moreover, a 5th semiconductor layer 7 of the 1st conductivity type is also provided to the surface of a substrate 1 except for the 1st conductor layer 2. Moreover, a 1st metal wire 10 connected to the 2nd semiconductor layer 4 and the 3rd semiconductor layer 5 and is also connected to the input terminal 14 of a semiconductor element and a 2nd metal wire 11 which is connected to the 4th semiconductor layer 6 and the 5th semiconductor to the 4th semiconductor layer 6 and the 5th semiconductor layer 7 and is also connected to the earth terminal of semiconductor element are provided. In this case, for example, the 2nd semiconductor layer 4, 1st semiconductor 2 and the substrate 1 form an NPN bipolar transistor 12 and the 3rd semiconductor layer 5 and 1st semiconductor layer 2 form a diode 13.
申请公布号 JPS62224960(A) 申请公布日期 1987.10.02
申请号 JP19860067165 申请日期 1986.03.27
申请人 TOSHIBA CORP 发明人 TOYOSHIMA YOSHIAKI;NIITSU YOICHIRO
分类号 H01L27/06;H01L21/8234;H01L27/02;H01L29/78 主分类号 H01L27/06
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