发明名称 MEASURING INSTRUMENT FOR GRATING CONSTANT
摘要 PURPOSE:To easily attain restoration to an original state with good reproductivity even at the time of subsequent sample replacement ad the movement of a turntable by adjusting the axis of rotation of sample crystal at right angles to an X-ray beam. CONSTITUTION:Both X rays 12 and 13 emitted by an X-ray source 11 are made monochromatic by monochrometers 14 and 15 and then made incident on the sample crystal 16. The monochromatic X ray 17 is diffracted by the crystal 16 and incident on a detector 20 as a diffracted ray 19, which is measured. Then when the rotary part 40 of the turntable 22 is rotated by about 180 deg., the diffracted ray of an X-ray beam 18 is measured by a detector 21 as well as the X-ray beam 17. At this time, the quantity of displacement of the axis of rotation of the crystal 16 and variation in the diffraction intensity caused by the detector 21 are obtained as a diffraction intensity curve to obtain the grating constant of the sample crystal 16 as the fine quantity of variation in Bragg angle. Therefore, the restoration to the original state is easily attained with respect to the subsequent sample replacement, etc.
申请公布号 JPS62223655(A) 申请公布日期 1987.10.01
申请号 JP19860065624 申请日期 1986.03.26
申请人 HITACHI LTD 发明人 KAWAGUCHI KOJI;ISHIBA TSUTOMU;TAKANO YUKIO;TAJIMA TAKESHI;MATSUO AKIHIKO
分类号 G01N23/207 主分类号 G01N23/207
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