发明名称 FORMATION OF THIN METALLIC FILM ON SINTERED SILICON CARBIDE BODY
摘要 <p>PURPOSE:To improve the adhesiveness of both thin metallic films on a sintered SiC body by forming the thin metallic film essentially consisting of Ti and the thin metallic film having excellent electrical conductivity by a sputtering or vapor deposition method on the surface of the sintered SiC body then subjecting the films to a heat treatment. CONSTITUTION:The surface of the sintered SiC body substrate contg. AlN in a 2-45wt% range and having a high insulating characteristic is subjected to reverse sputtering in a gaseous Ar atmosphere, by which the native oxide film SiO2 formed on the surface is removed. The surface is then cleaned and roughened by treating the same with a hydrofluoric acid, etc., and the Ti is deposited by evaporation to 0.01-10mum thickness on such surface by the sputtering or vapor deposition method. The thin conductive metallic film consisting of Cu, etc., is formed thereon to 2-3mum thickness in succession thereof. The substrate is finally heated for about 10min at 550-650 deg.C in an H2 atmosphere to form a composite chemical material at the boundary between the sintered SiC body substrate and thin Ti film and the boundary between the thin Ti film and the thin Cu, film, by which the sintered SiC body substrate, the thin Ti film, and the thin Cu film are respectively securely bonded.</p>
申请公布号 JPS62222054(A) 申请公布日期 1987.09.30
申请号 JP19860062380 申请日期 1986.03.20
申请人 FUJITSU LTD;IBIDEN CO LTD 发明人 SUGIMOTO MASAHIRO;HARADA SHIGEKI;SUGIYAMA SUNAO;YAMAUCHI HIDETOSHI
分类号 C23C14/18;C23C14/58;H01L23/12;H01L23/14;H01L23/15;H05K3/14;H05K3/16 主分类号 C23C14/18
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