发明名称 AUTOMATIC TESTING SYSTEM
摘要 PURPOSE:To terminate the transaction operation test in a short period by preparing testing mechanisms corresponding to parts to be operated and controlling respective testing mechanisms individually in accordance with preliminarily determined operation procedures while overlapping. CONSTITUTION:Test equipment B is provided with input/output devices 1<-2>, 2<-2>, 3<-2>, and 4<-2> corresponding to an input/output device 1<-1> for information input from and output to the external and input/output devices 2<-1>, 3<-1>, and 4<-1> for medium transmission to and reception from the external which are provided in a device A to be tested. When the device A is tested, input/output devices 1<-2>-4<-2> are controlled individually by a control circuit 9 in accordance with preliminarily determined operation procedures while overlapping. Thus, each of input/output devices 1<-2>-4<-2> is always held in the state waiting for start, and the transaction operation test is terminated in a short period.
申请公布号 JPS62214474(A) 申请公布日期 1987.09.21
申请号 JP19860056818 申请日期 1986.03.17
申请人 HITACHI LTD 发明人 MORI MASANOBU;HAGIWARA AKIRA
分类号 G07D9/00;G06F11/22 主分类号 G07D9/00
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