| 摘要 |
PURPOSE:To achieve a higher reliability and efficiency of inspection, by comparing data from a reference data memory in which data of a test pattern preset for inspection is stored with a data signal of a test pattern received from a part to be inspected to output a signal when they are not the same. CONSTITUTION:A reference test pattern is generated beforehand to be stored into a reference data memory 1. A test pattern signal generator section 9 generates a test pattern signal completely the same as the data in the memory 1 to be inputted into a part 7 to be inspected. A control section 3 receives a direction of loading a test pattern into the memory 1, a direction of starting or stopping data comparison and a synchronous clock from the part 7 being inspected and tells the memory 1 to perform a writing or reading an output s data at an address corresponding to the received test pattern signal while operating a data comparison section 2 to output a timing signal for comparison. Then, data of the memory 1 is compared with an output signal of the part 7 being inspected 7 serially one dot at a time and when they are not the same, a non-coincidence signal is outputted to be shown at the position corresponding to a defective dot on a display section 8.
|
