| 摘要 |
PURPOSE:To inspect a high-density mounted circuit board by determining pressing forces of respective contact probe pins to electrodes of the circuit board individually according to the intensity of magnetic poles. CONSTITUTION:A contact probe pin 1 has a magnetic pole formed axially, and contact probe pin holding plates 4 and 5 which hold the contact pin 1 slidably in the electrode direction of the circuit board 2 to be inspected and an electromagnet 1c which slides the pin 1 nearby the holding plates 4 and 5 are provided. Then, magnetic poles of plural pins 1 are formed and when the magnet 1c produces a magnetic field in the axial direction of the pin 1, the pin 1 slides while held by the holding plates 4 and 5 according to the direction of the magnetic field. Consequently, the head 1a of the pin 1 contacts the electrode of the board 2 and the pressing force of the pin 1 to the electrode is determined by the intensity of the magnetic field of the magnet 1c, so that the pin abuts on the electrode with specific pressure. Therefore, a coil spring is not necessary and the structure of the pin 1 is reduced in size.
|
