发明名称 PATTERN INSPECTING METHOD
摘要 PURPOSE:To detect a defect to some extent of one picture element even when a positioning error is present by comparing a gradient vector obtained from the density distribution of the image of a pattern to be inspected and the density distribution of the image of a reference pattern. CONSTITUTION:When respective density distributions of an image 11 of a multi- value pattern to be inspected and an image 12 of the multi-value reference pattern are f(xi,yj) and g(xi,yj), respective gradient vectors A and B are calculated from these density distributions. At such a time, considering the positioning error of both patterns, a gradient vector A(xi,yj), B(xi,yj) and an adjoining gradient vector B(xk,yl) are compared, the minimum value at the range of k=i-1, i,i+1,l=j-1, j,j+1 of an absolute value ¦B(xk,yl)-A(xi,yj)¦ of the difference in the vectors is made into C(xi,yj), and when the picture element is present which comes to be C(xi,yj)>=V to a set threshold V, it is decided that the defect is present at the pattern to be inspected.
申请公布号 JPS62177681(A) 申请公布日期 1987.08.04
申请号 JP19860017829 申请日期 1986.01.31
申请人 TOSHIBA MACH CO LTD 发明人 KASAHARA IZUMI;TOKITA MASAKAZU
分类号 G01N21/88;G01B11/24;G01N21/93;G01N21/956;G06K9/00;G06K9/36;G06T1/00;G06T7/00;H01L21/66 主分类号 G01N21/88
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