| 摘要 |
PURPOSE:To enable the determination of the expansion of multiplex echoes with less personal differences to be effected, by converting multiplex echo into square waves to count the expansion of the square waves by a reference clock. CONSTITUTION:A calibration/measurement switch 14 is set to the calibration position to set gate width and gate level in a necessary range for covering multiplex echoes of a material to be inspected. Then a value for the determination of the material being inspected to be deflective is set with decision value setter 19. The frequency of a reference clock of a clock generation circuit 18 is adjusted so that a value counted by a reference clock will be 100% on a display unit 20. Then, the switch 14 is set to the measurement position to receive multiplex echoes. Multiplex echoes within the gate width and exceeding gate level are picked up with a gate circuit 8 and converted into square waves with a waveform shaping circuit 15. As when the expansion of the square waves are counted with a counting circuit 17 using the reference clock of a circuit 18, quantitative counts are obtained. They are shown on the display unit 20 to determine the percentage value. Furthermore, the count values are compared with set reference value by a comparator 21 to judge and display the propriety.
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