发明名称 SURFACE WAVE PROBE
摘要 PURPOSE:To make it possible to accurately measure the value of stress acting on the surface of a matter and the depth of the surface crack of the matter in a non- destructive state, by providing a surface wave transmitting body to the probe surface of a probe for the surface wave of an ultrasonic wave having a vibrator and a delay material so as to contact the same with said probe surface and forming the part contacting with a test body of the transmitting body into a linear or narrow strip like shape. CONSTITUTION:The probe surface 1c of a surface wave probe 1 is fixed to the surface 2b of a surface wave transmitting body 2 by an adhesive and the leading end 2a of the transmitting body 2 is linearily contacted with the surface of a test body 3. The ultrasonic wave transmitted from the probe 1 propagates through the surface 2b of the transmitting body 2 to reach the test body 3 at the leading end part 2a thereof to be propagated to the direction shown by an arrow B (J). The ultrasonic wave propagated from the transmitting probe 1 to the direction shown by the arrow B (J) is detected by receiving probes 1' provided so as to leave an interval M therebetween and sonic velocity is measured. By measuring the sonic wave with good accuracy, the value of stress acting on the surface of the test body 3 or the depth of the surface crack of said body 3 can be accurately measured in a non-destructive state.
申请公布号 JPS62172260(A) 申请公布日期 1987.07.29
申请号 JP19860015402 申请日期 1986.01.27
申请人 HITACHI METALS LTD 发明人 SUETSUGU TOYOKI;YAKURA ISAO;NISHIMURA YOSHIHIRO;SHIMADA HEIHACHI
分类号 G01N29/28;G01N29/04;G01N29/24 主分类号 G01N29/28
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