发明名称 |
Method and apparatus for rapidly testing capacitors and dielectric materials |
摘要 |
The apparatus comprises a measuring unit (300) which receives a component to be tested (Cx) in series with a reference impedance in a measuring chain, a clock (100) suitable for applying repetitive stimulating pulses to the measuring chain, means for resetting the voltage at the terminals of the reference impedance to zero during each inactive half-cycle of the stimulating pulses, sampling means (400) which sample the response at instants which are progressively shifted relative to the stimulating pulses, and a processing unit (200) which analyzes the samples taken by the sampling unit to deduce the parameters of the tested item using a Foster model.
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申请公布号 |
US4683417(A) |
申请公布日期 |
1987.07.28 |
申请号 |
US19850733149 |
申请日期 |
1985.05.10 |
申请人 |
UNIVERSITE DE RENNES I |
发明人 |
DE BURGAT, MICHEL;LE TRAON, ANDRE;PILET, JEAN-CLAUDE;SHARAIHA, AMMAR |
分类号 |
G01R27/26;G01R31/01;(IPC1-7):G01R27/26;G01R11/52 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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