发明名称 |
PLASMA PROCESSOR |
摘要 |
PURPOSE:To measure at good S/N ratio in a plasma processor by mounting an infrared spectroscope on one side and an independent plasma diagnosing infrared ray source on the other of a bell-jar for performing a plasma reaction of a plasma chemical vapor-phase deposition unit to obtain infrared rays having strong intensity. CONSTITUTION:A known infrared spectroscope body 9 and an independent infrared ray source 1 opposed through a bell-jar 12 to the body 9 are mounted on an elevationally movable trestle 11 on both sides of the bell-jar 12 for performing a plasma reaction. The light emitted from the source 1 is transmitted through a mirror system in a cover 4 and a slit 2 into a plasma in the bell-jar 12, and introduced by a mirror system in a cover 5 into the spectroscope 9. The optical path length from the source 1 to the spectroscope 9 can be shortened to approx. 1/2 by mounting the source 1. Thus, light having strong intensity can be introduced to measure at good S/N ratio.
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申请公布号 |
JPS62154620(A) |
申请公布日期 |
1987.07.09 |
申请号 |
JP19850294136 |
申请日期 |
1985.12.26 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
YABUMOTO CHIKAKUNI;OSHIMA MASAHARU;MURAMATSU YASUSHI |
分类号 |
H01L21/205;H01L21/302;H01L21/3065;H01L21/31 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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