发明名称 BURN-IN BOARD OF BURN-IN APPARATUS FOR SEMICONDUCTOR APPARATUS
摘要 PURPOSE:To enable the inspection of an output signal in a burn-in state from the outside with good efficiency, by mounting a signal retrieving connector for retrieving the input signal or output signal of a device to be tested to the outside of a board at this side of the board. CONSTITUTION:A monitor signal retrieving connector 10 is mounted to this side part of a board main body 1, for example, to the protruded leading end edge part on said board main board 1. In the burn-in test of a device 5 tested by a burn-in apparatus having said board main body 1, the input signal of the device 5 tested or the output signal thereof in an burn-in state can be retrieved to the signal waveform monitor apparatus outside the board main body 1 through the monitor signal retrieving connector 10 and a signal waveform can be inspected with good efficiency.
申请公布号 JPS62153778(A) 申请公布日期 1987.07.08
申请号 JP19850294033 申请日期 1985.12.27
申请人 TOSHIBA CORP 发明人 KUDO TETSUYA
分类号 G01R31/26;G01R31/30 主分类号 G01R31/26
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