| 摘要 |
PURPOSE:To enable accurate measuring of a size of an object having a partial defect, by employing a digital system. CONSTITUTION:A visual field signal H is applied to clock counters CC8, FF6 and an inverter INV11 from a visual field signal generator. The scanning of an infrared detector detects an end part of an object 3, and if a size signal A is applied to a comparison circuit 5, the output of the FF6 is applied to a CK terminal of a start resistor 9 at a rize of a comparison output to record a value X1 of the current CC8. A low-temperature part 4 of the object 3 is then scanned, a circuit 5 outputs a 0, and the output is applied to a CK terminal of a terminal resistor 10 via an INV7 to record a value Y2 of the CC8. If scanning of the object 3 is complete, a value Y2 of the CC8 is recorded in the resistor 10. If the signal H goes to a 0, the value X1 is stored in a memory 12, the value Y2 is stored in a memory 13, reduction (14) of each memory value is performed, and a reduction value W multiplied (15) by a coefficient to obtain an accurate size Wo of the object 3. |
