发明名称 PLASMA PROCESSOR
摘要 PURPOSE:To accurately anisotropically etch in a plasma processor by focusing the line of magnetic force of a Miller magnetic field through which a plasma is passed perpendicularly to a substrate near an electrode opposed to the substrate. CONSTITUTION:A high frequency voltage is applied to between an anode 11 and a cathode 15 to generate a plasma P between the anode 11 and the cathode 15. An annular magnet 19 is so mounted as to surround the anode 11, a magnet 21 is further mounted under a bottom plate 13b, and a Miller magnetic field M is formed in a chamber 13. The line H of magnetic force of the magnetic field is focused near the anode 11, and passed through the plasma P in a direction perpendicular to a substrate 23. A plurality of magnets 31 are arranged on the inner peripheral wall 13c of the chamber 13 so that poles are arranged laterally and longitudinally in a zigzag manner to form a multiplex bipole surface magnetic field for returning charged particles flown from the plasma P to the wall 13c of the chamber 13 to the plasma P. Thus, the substrate 23 can be accurately anisotropically etched.
申请公布号 JPS62147733(A) 申请公布日期 1987.07.01
申请号 JP19850289592 申请日期 1985.12.23
申请人 ANELVA CORP 发明人 NOGAMI YUTAKA
分类号 H01L21/205;H01L21/302;H01L21/31 主分类号 H01L21/205
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