| 摘要 |
PURPOSE:To make the operation of a microprocessor at the time of test coincide with that of the microprocessor at the time of practical operation and to reduce the number of test terminals by storing a test program and a practical operation program in a program memory. CONSTITUTION:The practical operation program and the test program are stored in the program memory 4. When a logical value for specifying the practical operation of the microprocessor is applied to a control terminal 5, a program counter 1 outputs the addresses of the practical operation program stored in the memory 4 successively. When a logical value for specifying the test of the microprocessor is applied to the control terminal 5, the program counter 1 outputs the addresses to the memory 4 by regarding an address inputted from a program address I/O terminal 2 as an initial address. A gate circuit 3 is opened only when the logical value for specifying the test of the microprocessor is applied to the control terminal 5. |
