| 摘要 |
PURPOSE:To easily test a semiconductor storage device which uses a static memory cell by forming a ring oscillator in a chip by using a NOT circuit equivalent to a memory cell. CONSTITUTION:The static type memory cell is formed of two NOT circuits NOT, and when the NOT circuit equivalent to the circuits NOT is connected to the memory cell, the ring oscillation circuit is formed by even-numbered connection such as three-stage connection. The oscillation output of this oscillation circuit is monitored to observe an oscillation period 6Td for the write time 2Td of a storage circuit, and the semiconductor cell which uses the static type memory cell is easily tested without using an IC tester nor a measurement program. |
