| 摘要 |
PURPOSE:To analyze compsn. with high accuracy by using the correlation between the ratio of the intensities of the fluorescent X-rays to each of an element to be measured and matrix element and the concn. ratio of the element to be measured and the matrix element for a calibration curve. CONSTITUTION:X-rays are irradiated to a sample consisting of a binary system of the element to be measured and the matrix element and the compsn. of the sample is determined by using the measured values of the intensity of the fluorescent X-rays generated from the sample. The correlation coefft. between the ratio of the intensities of the fluorescent X-rays relating to each of the element to be measured and the matrix element and the concn. ratio of the element to be measured and the matrix element is used as the calibration curve. Then the fluctuations in the intensity of the fluorescent X-rays occurring in the surface shape and setting position of the sample are offset. The compsn. is thus analyzed with high accuracy.
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