发明名称 DEFECT DETECTING DEVICE
摘要 PURPOSE:To detect exactly a defect even if the set value of a discriminating level is changed in an image scanning period, by inspecting whether the set discriminating level is correct or erroneous, and changing the discriminating level by synchronizing with an image signal when said level is correct. CONSTITUTION:When an image sensor output S1 synchronizing with a start signal S4 is being detected as to its defect by am amplifier 23, discriminators 24a, 24a and magnitude discriminators 25a, 25b, if discriminating levels V1, V2, D1, and D2 are changed through a setting device 26, a changed data is stored in a temporary data memory 28. A CPU 29 compares this data with a data set in advance, and when it is normal, data changing signal S5 is outputted to a start signal generating circuit 32, and also new data V1, V2, D2, and D2 in the memory 28 are transferred to memories M1-M3. When the signal S5 is inputted, the circuit 32 outputs a data transfer signal S6 to the memories M1-M3, and new discriminating levels V1, V2, D1, and D2 are outputted. The discriminators 24a, 24b, and the discriminators 25a, 26b detect the defect of the output S1 by new discriminating levels V1, V2, D1, and D2 from the next scan.
申请公布号 JPS62135752(A) 申请公布日期 1987.06.18
申请号 JP19850277351 申请日期 1985.12.10
申请人 OMRON TATEISI ELECTRONICS CO 发明人 OGINO KENJI
分类号 G01N21/88;G01N21/93;G01N21/94 主分类号 G01N21/88
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