发明名称 Apparatus and method for handling a workpiece
摘要 An apparatus and method for handling a workpiece includes the combination of a first workpiece position for checking the presence of a workpiece and a second subsequent position for checking the orientation of a workpiece. An orientation device adjacent the orientation checking position orients the workpiece to a proper position for subsequent transportation to a third workpiece position such that acceptable workpieces may be segregatably removed to a subsequent handling location.
申请公布号 US4669599(A) 申请公布日期 1987.06.02
申请号 US19850704652 申请日期 1985.02.22
申请人 ADVANCED SEMICONDUCTOR MATERIALS FICO TOOLING, B.V. 发明人 DIJKMEIJER, H. E.;PAS, IRENEUS J. T. M.
分类号 B23Q7/16;B65G43/08;B65G47/244;(IPC1-7):B65G47/24 主分类号 B23Q7/16
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