发明名称 Generating high purity ions by non-thermal excimer laser processing
摘要 A semiconductor ion implantation processing technique is disclosed for implanting high purity, high flux density ions in a semiconductor wafer substrate. A reactant gas is irradiated with excimer pulsed ultraviolet laser radiation at a discrete designated pulsed wavelength corresponding to a discrete designated ionization excitation energy of the gas photochemically breaking bonds of the gas to nonthermally photolytically ionize the gas. The ions are then accelerated by an electric field for subsequent implantation into a surface.
申请公布号 US4670064(A) 申请公布日期 1987.06.02
申请号 US19850721551 申请日期 1985.04.10
申请人 EATON CORPORATION 发明人 SCHACHAMEYER, STEVEN R.;BENJAMIN, JAMES A.;PARDEE, JOHN B.;HOPPIE, LYLE O.
分类号 H01J27/24;H01J37/08;H01J37/317;(IPC1-7):H01L21/265;B01J1/10 主分类号 H01J27/24
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