发明名称 Method for making submicron mask openings using sidewalls and lift-off techniques.
摘要 <p>A method is disclosed for making submicron openings in a substrate. A mesa is formed on the substrate by reactive ion etching techniques. A film is deposited over the entire structure and the mesa is selectively etched away to yield a submicron-sized opening in the film. Using the film as a mask, the substrate exposed thereby is reactively ion etched. An example is given for producing an emitter mask for a polycrystalline silicon base bipolar transistor. </p>
申请公布号 EP0223032(A2) 申请公布日期 1987.05.27
申请号 EP19860113666 申请日期 1986.10.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COOK, ROBERT KIMBALL;SHEPARD, JOSEPH FRANCIS
分类号 H01L21/302;H01L21/033;H01L21/3065 主分类号 H01L21/302
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