发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To reduce an inspection time by inspecting whether the write of a write information and the read of a read information are performed exactly by detecting that n-pieces of an inspection read information has not the same content as a reference information having the same content as the inspection write information. CONSTITUTION:When the inspection information is read out and during the inspection, the reference information having the same contents as the one supplied to an information input line 5 at the write time of the inspection information is supplied to the information input line 5, and it is supplied to a reference information input line T' in a detection circuit 12 through an information input circuit 6, an information input line 1, a switching selection circuit 11, and a reference information input line T. Therefore, at the inspection circuit 12, whether at least one among the n-pieces of inspection read information read out from n-pieces of information memory cells Urj, and U(a+r)j...U(q-a+r)j in an information memory array 1 has the same content as the reference information or not is compared and inspected.
申请公布号 JPS62109294(A) 申请公布日期 1987.05.20
申请号 JP19850248582 申请日期 1985.11.06
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 MATSUMURA TSUNEO;YAMADA JUNZO;MANO TSUNEO
分类号 G11C11/401;G11C11/34;G11C29/00;G11C29/12 主分类号 G11C11/401
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