发明名称 APPARATUS FOR MEASURING AMOUNT OF REFLECTION
摘要 PURPOSE:To perform accurate measurement of the amount of reflection, by arranging a light source at a position perpendicular to a sample measuring reference plane, and arranging a pair of light receiving parts symmetrically with respect to a vertical axis connecting the light source and the sample measuring reference plane. CONSTITUTION:A light source 1 is arranged at a position, which is substantially perpendicular to a horizontal sample measuring reference plane A. A pair of equivalent light receiving parts is arranged at symmetrical positions with respect to a vertical Y axis, which connects the light source 1 and the plane A. An adding means 3, which electrically or optically adds the outputs of the light receiving parts 2 and 2, is connected. When a sample S is inclined with respect to the plane A, the output of one light receiving part 2 is changed. The output of the other light receiving part 2 is changed approximately symmetrically with respect to the output of the first light receiving part 2. The outputs of the light receiving parts 2 and 2 are added thereto. The the measured output, which is twice the output of the light receiving parts 2 and 2 when the sample S is set at the plane A, is obtained. When the measured output is divided by 2, the accurate measured output of the reflected amount can be obtained.
申请公布号 JPS6296848(A) 申请公布日期 1987.05.06
申请号 JP19850237050 申请日期 1985.10.23
申请人 UNION GIKEN:KK 发明人 SEKIWA MITSUNAO;HAMADA TETSUO
分类号 G01N21/47 主分类号 G01N21/47
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