发明名称 Doping a silicon substrate by ion bombard-ment
摘要 <p>Method of doping a semiconductor to form a pn junction, by ion implantation without the passivation of the junction on the surface of the semiconductor. After the impurity ion has been implanted to the desired amount, further bombardment for driving back the dopant ion into the body, is carried out using ions of light-weight inert gases.</p>
申请公布号 FR2083348(A1) 申请公布日期 1971.12.17
申请号 FR19710009218 申请日期 1971.03.16
申请人 WESTERN ELECTRIC 发明人
分类号 H01L21/00;H01L21/265;(IPC1-7):01L7/00 主分类号 H01L21/00
代理机构 代理人
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