SAMPLE STAGE FOR ELECTRON MICROSCOPE,申请号JP19850211527-传众专利搜索

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发明名称	SAMPLE STAGE FOR ELECTRON MICROSCOPE
摘要
申请公布号	JPS6271157(A)	申请公布日期	1987.04.01
申请号	JP19850211527	申请日期	1985.09.24
申请人	NEC CORP	发明人	KAMESHIMA YASUBUMI
分类号	H01J37/20	主分类号	H01J37/20
代理机构		代理人
主权项
地址

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