发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To overlap both gates without an extra space for isolating both gates, by providing a two-layer structure of a selecting gate and a floating gate. CONSTITUTION:An element isolating region 10 is formed on a substrate 11. Then, after a gate oxide film is formed, a word line 3 is formed with a first polycrystalline Si layer, and an interlayer insulating film is formed. Then, a tunnel oxide film 6 is formed. Thereafter, impurities are implanted in a gate region, and regions 8, 9 and 12 are formed. Then, a floating gate 2 is formed with a second polycrystalline Si layer, and an interlayer insulating film is formed. Then, a control gate 1 is formed with a third polycrystalline Si layer, and an interlayer insulating film is formed. Finally, a bit line 4 is formed.
申请公布号 JPS6269563(A) 申请公布日期 1987.03.30
申请号 JP19850209789 申请日期 1985.09.21
申请人 MITSUBISHI ELECTRIC CORP 发明人 ARIMA HIDEAKI;AJIKA NATSUO
分类号 H01L21/8247;H01L27/112;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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