发明名称 Increase in deep trench capacitance by a central ground electrode
摘要 A semiconductor device includes a trench formed in a substrate, and a diffusion region surrounding the trench to form a buried plate. A first conductive material is formed in the trench and connects to the buried plate through a bottom of the trench to form a first electrode. A second conductive material is disposed in the trench to form a second electrode. A node dielectric layer is formed between the first electrode and the second electrode.
申请公布号 US2002167045(A1) 申请公布日期 2002.11.14
申请号 US20010852899 申请日期 2001.05.10
申请人 SHORT ALVIN P. 发明人 SHORT ALVIN P.
分类号 H01L21/8242;H01L29/94;(IPC1-7):H01L29/76;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/8242
代理机构 代理人
主权项
地址