发明名称 |
APPARATUS FOR INSPECTING SURFACE OF TRANSPARENT SPECIMEN PLATE |
摘要 |
PURPOSE:To enhance an S/N by perfectly eliminating beam reflected and scattered to a transparent specimen plate, by providing a beam trap means in the vicinity of the transparent specimen plate in the side of a laser beam transmitting direction. CONSTITUTION:A light trap means 9 is provided in the vicinity of a transparent specimen plate 8 in the side of a laser beam transmitting side. By this constitution, the laser beam transmitted through the transparent specimen plate 8 is received by the beam trap means 9 and can be attenuated by guiding said beam to the direction different from the position where the transparent specimen plate 8 has been held while said beam is reflected many times. Therefore, the beam reflected and scattered to the transparent specimen plate 8 is perfectly eliminated and the beam scattered from a part other than the surface of said specimen plate 1 is prevented from being incident to a photoelectric converter 6 receiving scattering beam from the surface of the transparent specimen plate as stray beam and a S/N ratio is enhanced. |
申请公布号 |
JPS6211135(A) |
申请公布日期 |
1987.01.20 |
申请号 |
JP19850136162 |
申请日期 |
1985.06.24 |
申请人 |
HITACHI ELECTRONICS ENG CO LTD |
发明人 |
NAKAJIMA HIROSHI;HOURAI IZUO;KATO NOBORU |
分类号 |
G01N21/94;G01N21/89;G01N21/958 |
主分类号 |
G01N21/94 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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