发明名称 JIG FOR ANALYZER EQUIPMENT
摘要 PURPOSE:To enable the adjustment of the irradiation position of a beam while a sputtering beam is being radiated, by arranging a rod made of material easy to ionize piercing the center of columnar body made of hard to ionize material while a material layer is formed on the side and bottom thereof. CONSTITUTION:A metal rod 1 is buried into a columnar insulating resin 2 to form a jig, which is loaded into a metal sample holder 4. Then, a metal layer 3 is formed on the side and the bottom of the resins 2. The holder 4 is connected to an ammeter 5. center 7 of electron beam for analysis is set to the center of the metal rod 1 and a sputter beam 6 is adjusted to maximize the pointer of the ammeter 5. This enables the adjustment of the irradiation position with the beam while the sputter beam is being irradiated.
申请公布号 JPS625159(A) 申请公布日期 1987.01.12
申请号 JP19850143970 申请日期 1985.07.02
申请人 OKI ELECTRIC IND CO LTD 发明人 AJIOKA TSUNEO;AIKAWA IZUMI;UCHIDA EIJI
分类号 G01N23/225;H01J37/20 主分类号 G01N23/225
代理机构 代理人
主权项
地址